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1

Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV

Aspnes, D., Studna, A.

Journal:

Physical Review B

Year:

1983

Language:

english

File:

PDF, 1.05 MB

english, 1983

2

Dielectric properties of heavily doped crystalline and amorphous silicon from 1.5 to 6.0 eV

Aspnes, D. E., Studna, A. A., Kinsbron, E.

Journal:

Physical Review B

Year:

1984

Language:

english

File:

PDF, 1.71 MB

english, 1984

3

Schottky-Barrier Electroreflectance: Application to GaAs

Aspnes, D. E., Studna, A. A.

Journal:

Physical Review B

Year:

1973

Language:

english

File:

PDF, 1.80 MB

english, 1973

4

Optical reflectance and electron diffraction studies of molecular-beam-epitaxy growth transients on GaAs(001)

Aspnes, D. E., Harbison, J. P., Studna, A. A., Florez, L. T.

Journal:

Physical Review Letters

Year:

1987

Language:

english

File:

PDF, 211 KB

english, 1987

5

Kinetic Limits of Monolayer Growth on (001) Gaas by Organometallic Chemical-vapor Deposition

Aspnes, D. E., Colas, E., Studna, A. A., Bhat, R., Koza, M. A., Keramidas, V. G.

Journal:

Physical Review Letters

Year:

1988

Language:

english

File:

PDF, 679 KB

english, 1988

6

Optical properties of anodically grown native oxides on some Ga-V compounds from 1.5 to 6.0 eV

Aspnes, D. E., Schwartz, B., Studna, A. A., Derick, L., Koszi, L. A.

Journal:

Journal of Applied Physics

Year:

1977

Language:

english

File:

PDF, 572 KB

english, 1977

7

Reflectance-difference studies of organometallic chemical vapor deposition growth transients on (100) GaAs

E. Colas, D.E. Aspnes, R. Bhat, V.G. Keramidas, M.A. Koza, A.A. Studna

Journal:

Journal of Crystal Growth

Year:

1988

Language:

english

File:

PDF, 81 KB

english, 1988

8

Reflectance-difference studies of organometallic chemical-vapor-deposition growth transients on (001) GaAs

E. Colas, D.E. Aspnes, R. Bhat, A.A. Studna, M.A. Koza, V.G. Keramidas

Journal:

Journal of Crystal Growth

Year:

1989

Language:

english

File:

PDF, 546 KB

english, 1989

9

In situ monitoring of crystal growth by reflectance difference spectroscopy

E. Colas, D.E. Aspnes, R. Bhat, A.A. Studna, J.P. Harbison, L.T. Florez, M.A. Koza, V.G. Keramidas

Journal:

Journal of Crystal Growth

Year:

1991

Language:

english

File:

PDF, 663 KB

english, 1991

10

Direct observation of the E0 and E0 + Δ0 transitions in silicon

D.E. Aspnes, A.A. Studna

Journal:

Solid State Communications

Year:

1972

Language:

english

File:

PDF, 340 KB

english, 1972

11

High-resolution ellipsometric measurements of Ni from 1.8 to 3.5 eV

Journal:

Solid State Communications

Year:

1975

Language:

english

File:

PDF, 220 KB

english, 1975

12

Kinetic limits to growth on (001) and (110) GaAs by OMCVD

D.E. Aspnes, E. Colas, A.A. Studna, R. Bhat, M.A. Koza, V.G. Keramidas

Journal:

Year:

1990

Language:

english

File:

PDF, 364 KB

english, 1990

13

An investigation of ion-bombarded and annealed surfaces of Ge by spectroscopic ellipsometry

D.E. Aspnes, A.A. Studna

Journal:

Surface Science Letters

Year:

1980

Language:

english

File:

PDF, 69 KB

english, 1980

14

“Transparent” metals: preparation and characterization of light-transmitting palladium, rhodium, and rhenium films

Y. Degani, T.T. Sheng, A. Heller, D.E. Aspnes, A.A. Studna, J.D. Porter

Journal:

Journal of Electroanalytical Chemistry and Interfacial Electrochemistry

Year:

1987

Language:

english

File:

PDF, 3.36 MB

english, 1987

15

Geometrically Exact Ellipsometer Alignment

Aspnes, D. E., Studna, A. A.

Journal:

Year:

1971

Language:

english

File:

PDF, 903 KB

english, 1971

16

High Precision Scanning Ellipsometer

D. E. Aspnes, A. A. Studna

Journal:

Year:

1975

Language:

english

File:

PDF, 1.14 MB

english, 1975

17

Dielectric function measurements on ion-implanted metallic systems

Kaufmann, E. N., Aspnes, D. E., Rodgers, J. W., Studna, A. A.

Journal:

Journal of the Optical Society of America

Year:

1977

Language:

english

File:

PDF, 366 KB

english, 1977

18

High-resolution electroreflectance measurements of GaAs

D.E. Aspnes, A.A. Studna

Journal:

Surface Science

Year:

1973

Language:

english

File:

PDF, 420 KB

english, 1973

19

An investigation of ion-bombarded and annealed 〈111〉 surfaces of Ge by spectroscopic ellipsometry

D.E. Aspnes, A.A. Studna

Journal:

Surface Science

Year:

1980

Language:

english

File:

PDF, 818 KB

english, 1980

20

Anisotropies in the Above—Band-Gap Optical Spectra of Cubic Semiconductors

Aspnes, D. E., Studna, A. A.

Journal:

Physical Review Letters

Year:

1985

Language:

english

File:

PDF, 177 KB

english, 1985

21

Direct optical measurement of surface dielectric responses: Interrupted growth on (001) GaAs

Aspnes, D. E., Chang, Y. C., Studna, A. A., Florez, L. T., Farrell, H. H., Harbison, J. P.

Journal:

Physical Review Letters

Year:

1990

Language:

english

File:

PDF, 202 KB

english, 1990

22

PŮVOD STAROČESKÉ ROZPRÁVKY O UHLÍŘOVĚ POSUŇKOVÉ DISPUTACI VE FRANTOVÝCH PRÁVECH

Čestmír Studna

Journal:

Listy filologické / Folia philologica

Year:

1961

Language:

czech

File:

PDF, 1.10 MB

czech, 1961

23

Stability of (100)GaAs surfaces in aqueous solutions

Aspnes, D. E., Studna, A. A.

Journal:

Applied Physics Letters

Year:

1985

Language:

english

File:

PDF, 526 KB

english, 1985

24

Oscillations in the optical response of (001)GaAs and AlGaAs surfaces during crystal growth by molecular beam epitaxy

Harbison, J. P., Aspnes, D. E., Studna, A. A., Florez, L. T., Kelly, M. K.

Journal:

Applied Physics Letters

Year:

1988

Language:

english

File:

PDF, 638 KB

english, 1988

25

Optical properties and water absorption of anodically grown native oxides on InP

Journal:

Applied Physics Letters

Year:

1981

Language:

english

File:

PDF, 405 KB

english, 1981

26

Low-retardance fused-quartz window for real-time optical applications in ultrahigh vacuum

Year:

1989

Language:

english

File:

PDF, 570 KB

english, 1989

27

Optical characterization of a native oxide anodically grown on gallium antimonide

Aspnes, D. E., Schwartz, B., Studna, A. A., Derick, L.

Journal:

Applied Physics Letters

Year:

1976

Language:

english

File:

PDF, 400 KB

english, 1976

28

Schottky diode fabrication for electroreflectance measurements

Journal:

Review of Scientific Instruments

Year:

1975

Language:

english

File:

PDF, 552 KB

english, 1975

29

Reflectance-difference spectroscopy system for real-time measurements of crystal growth

Aspnes, D. E., Harbison, J. P., Studna, A. A., Florez, L. T.

Journal:

Applied Physics Letters

Year:

1988

Language:

english

File:

PDF, 535 KB

english, 1988

30

Methods for drift stabilization and photomultiplier linearization for photometric ellipsometers and polarimeters

Aspnes, D. E., Studna, A. A.

Journal:

Review of Scientific Instruments

Year:

1978

Language:

english

File:

PDF, 729 KB

english, 1978

31

SPIE Proceedings [SPIE 1981 Microlithography Conferences - San Jose (Monday 30 March 1981)] Optical Characterization Techniques for Semiconductor Technology - Optical Detection And Minimization Of Surface Overlayers On Semiconductors Using Spectroscopic Ellipsometry

Aspnes, D. E., Studna, A. A., Aspnes, David E., Potter, Roy F., So, Samuel S.

Year:

1981

Language:

english

File:

PDF, 1.62 MB

english, 1981

32

SPIE Proceedings [SPIE 21st Annual Technical Symposium - San Diego (Monday 22 August 1977)] Optical Polarimetry: Instrumentation and Applications - Photomultiplier Linearization And System Stabilization For Photometric Ellipsometers And Polarimeters

Aspnes, D. E., Studna, A. A., Azzam, Rasheed M. A., Coffeen, David

Year:

1977

Language:

english

File:

PDF, 213 KB

english, 1977

33

Kinetic Limits to Growth on GaAs by Omcvd

Aspnes, D. E., Bhat, R., Colas, E., Koza, M. A., Keramidas, V. G., Studna, A. A.

Journal:

MRS Proceedings

Year:

1989

Language:

english

File:

PDF, 958 KB

english, 1989

34

Optical Reflectance and Rheed Transients During Mbe Growth on (001) GaAs

Aspnes, D. E., Harbison, J. P., Studna, A. A., Florez, L. T.

Journal:

MRS Proceedings

Year:

1987

Language:

english

File:

PDF, 669 KB

english, 1987

35

Reflectance-Difference Spectroscopy: a New Real-Time, In-Situ Analysis of MBE and OMCVD Growth Surfaces.

Colas, E., Aspnes, D.E., Bhat, R., Studna, A.A., Koza, M.A., Keramidas, V.G.

Journal:

MRS Proceedings

Year:

1988

Language:

english

File:

PDF, 329 KB

english, 1988

36

SPIE Proceedings [SPIE 1989 Microelectronic Intergrated Processing Conferences - Santa Clara (Tuesday 10 October 1989)] Surface and Interface Analysis of Microelectronic Materials Processing and Growth - Reflectance-difference spectroscopy of GaAs crystal growth by OMCVD

Colas, E., Aspnes, D. E., Bhat, R., Studna, A. A., Koza, M. A., Keramidas, V. G., Brillson, Leonard J., Pollak, Fred H.

Year:

1990

Language:

english

File:

PDF, 694 KB

english, 1990

37

SPIE Proceedings [SPIE OPTCON '88 Conferences--Applications of Optical Engineering - Santa Clara, CA (Tuesday 1 November 1988)] Monitoring and Control of Plasma-Enhanced Processing of Semiconductors - Reflectance-Difference Spectroscopy: A New Look At Semiconductor Crystal Growth By MBE And OMCVD

Aspnes, D. E., Bhat, R., Colas, E., Florez, L. T., Harbison, J. P., Kelly, M. K., Keramidas, V. G., Kozo, M. A., Studna, A. A., Griffiths, James E.

Year:

1989

Language:

english

File:

PDF, 709 KB

english, 1989

38

SPIE Proceedings [SPIE 1988 Semiconductor Symposium - Newport Beach, CA (Monday 14 March 1988)] Spectroscopic Characterization Techniques for Semiconductor Technology III - In Situ Optical Measurements Of The Growth Of GaAs and AlGaAs By Molecular Beam Epitaxy

Aspnes, D. E., Harbison, J. P., Studna, A. A., Florez, L. T., Kelly, M. K., Glembocki, Orest J., Pollak, Fred H., Ponce, Fernando A.

Year:

1988

Language:

english

File:

PDF, 580 KB

english, 1988

39

ChemInform Abstract: “Transparent” Metals: Preparation and Characterization of Light-Transmitting Palladium, Rhodium, and Rhenium Films.

DEGANI, Y., SHENG, T. T., HELLER, A., ASPNES, D. E., STUDNA, A. A., PORTER, J. D.

Journal:

Year:

1987

File:

PDF, 148 KB

1987

40

[AIP AIP Conference Proceedings Volume 73 - ()] AIP Conference Proceedings - Surface chemical reactivity of plasma-deposited amorphous silicon

Aspnes, D. E., Bagley, B. G., Studna, A. A., Adams, A. C., Alexander, F. B.

Year:

1981

Language:

english

File:

PDF, 542 KB

english, 1981

41

[AIP AIP Conference Proceedings Volume 73 - ()] AIP Conference Proceedings - Surface chemical reactivity of plasma-deposited amorphous silicon

Aspnes, D. E., Bagley, B. G., Studna, A. A., Adams, A. C., Alexander, F. B.

Year:

1981

File:

PDF, 542 KB

1981